JEFFREY LAPRADE

Sonera — Berkeley, CA

• Standardized thin film deposition processes and relevant metrology for scalable reproducibility, seamless fab integration, and robust research foundations.
• Collaborate cross-functionally with Material Scientists, Device Engineers, ASIC Designers, RF Systems Engineers, and Computational Teams to drive sensor sensitivity improvements, maximize yield, and resolve materials challenges.
• Implemented companywide statistical analysis foundations — led Six Sigma-based DOE initiatives and root-cause analysis to optimize device performance and solve scaling challenges.
• Directed build-out of cleanroom and lab facility including equipment selection, characterization, maintenance, vendor negotiation, and safety compliance protocols.
• Hands-on design and execution of rapid prototyping of nanofabricated devices (via Marvell Nanolab), RF test stations, and Ultra High Vacuum systems.

Energetiq Technology — Wilmington, MA

• Scaled EUV light source production from single units to 8+ units per year — a new record for the company.
• Led cross-departmental planning sessions to optimize timelines and align resource allocation.
• Developed structured test plans, production documentation, and outsourced key processes to streamline operations and reduce material waste and rework through lean manufacturing principles.
• Partnered with technical teams on vacuum and cleanroom system maintenance, improving uptime and throughput.

Applied Materials — Gloucester, MA

• Supported R&D teams in feasibility testing of novel ion implanter configurations (HE XPT, MEHD, Neptune, 900 3D).
• Conducted root-cause troubleshooting across vacuum, HV, and data acquisition systems in both lab and customer environments.
• Contributed to customer demonstrations and experimental tool validations, enhancing credibility and sales enablement.
• Supported NPI delivery cycles through subsystem characterization, iterative refinement, and cross-functional alignment between engineering and customer-facing teams.

IBM — College of Nanoscale Science & Engineering, Albany, NY

• Managed metrology equipment portfolio (XRD, XRF, XPS, Ellipsometer, SEM, Brightfield) for semiconductor fab operations.
• Led failure analysis of EUV processes using SEM imaging and defect classification; contributed to automated defect detection system development.
• Maintained tool calibration, backups, and upgrades across metrology suite.

Stion Corporation

• Supported both manufacturing and R&D lines for CIGSS thin film photovoltaic device processing, providing daily process support and escalation response for deviations.
• Operated and maintained PVD, MOCVD, CVD, and laser etch systems across production and experimental process flows.
• Performed daily characterization including resistivity measurement, ellipsometry, and optical and SEM inspection to monitor film quality and process health.
• Maintained vacuum systems supporting continuous line uptime and process integrity.
• Led effort to minimize the ZnO nucleation layer via MOCVD process optimization, improving thin film device performance.